HIRMA: High-Performance Implementation for RISC-V Microcontroller Applications
Published in 2023 IEEE East-West Design & Test Symposium (EWDTS), 2023
This paper is about a RISC-V based Microcontroller designed and fabricated in 180nm CMOS.
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An Integrated Framework for Aging Analysis Based on an Age-Aware Cell Library
Published in 2025 IEEE European Test Symposium (ETS), 2025
This paper is about designing an age-aware timing simulation of digital circuits with age-aware cell libraries in SystemC.